The software’s organized layouts contain the minimum necessary functions for performing the required tasks. Both simple and complex measurements can be easily conducted using the software’s intuitive set of tools. The interface guides you through every step of the process, including image capture, image processing, and report creation. The dynamic user interface reduces desktop clutter and confusion by only displaying the tools and functions you want to use. Thin coating thickness evaluation (calotest method).Solutions for Surface Coatings and Thin Film Deposits (Coating Industries) Automatic critical dimension measurement.Solutions for Electronics (Electronic Device / Semiconductor Industries) Phase and region of interest measurement.Solutions for Machinery Processing (Automotive / Machined Parts Industries) Comparison of sample images with reference standards.Rating the non-metallic inclusion content.Grain sizing using the planimetric method.Grain sizing using the intercept counting method.Three-dimensional image display and measurement.Unique 'MIX' observation mode providing sample details from both brightfield and darkfield.HDR imaging for image contrast improvement.Seamlessly Integration with Olympus Optical Microscopes
Automatic tools for efficient image acquisition.Saving and recalling acquisition settings.Smart Technologies for Crisp Image Capture Try On OLYMPUS Stream for 30 days free of charge.Ĭlick "Request a Demo" and note that you would like a 30-day license in the first box.Įasy-to-Use Interface and Step-by-Step Guidance OEM Microscope Components for Integration.Semiconductor & Flat Panel Display Inspection Microscopes ▾.Aerospace/Wind Blade Inspection Scanners.Flaw Detectors / Phased Array Flaw Detectors ▾.Thickness and Flaw Inspection Solutions ▾.
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